Charged device model (CDM) ESD is considered to be the primary real-world ESD model for representing ESD charging and rapid discharge and is the best representation of what can occur in automated handling equipment used in manufacturing and the assembly of integrated circuits (ICs) today. It is well known that the largest cause by far of ESD damage to an IC during device handling in a manufacturing environment is from charged device events.
Prior to ANSI/ESDA/JEDEC JS-002, there were four existing standards: the legacy
- JEDEC (JESD22-C101),
- ANSI/ESD S5.3.1,
- AEC Q100-011,
- EIAJ ED-4701/300-2